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+{{ lmn:img3.gif|SemPhoto}}
+====== SEM-FEG Zeiss SUPRA™ 40 ======
+The scanning electron microscopy technique is versatile and non-destructive, it reveals the morphology
+and the composition of a lot of materials.
+The ZEISS SUPRA™ 40 is a SEM-FEG capable of high quality semples imaging.
+Perfect for investigateing nanosystems, it offers high stability and a large (130 mm) versatile specimen holder.
+Meanwhile, the GEMINI FESEM column utilised on the SUPRA™ 40 has an extremely low magnetic field
+outside the objective lens enabling investigation of magnetic materials and devices.
+A field-emission cathode in the electron gun provides improved spatial resolution and minimized sample charging/damage.
+**Performances:**
+__Nominal resolution:__ 1.5 nm at 10 KV and WD= 2mm
+__Acceleration voltage:__ 0.1 - 30 KV
+__Probe current:__ 4 pA-10 nA
+__Magnification:__ 12 - 900,000X
+__Working distance:__ it ranges from 1 to 50 mm, depending on the operating conditions
+The sample holder can host nine stubs. Each stub can contain samples of about 1 cm2.
+The SEM-FEG is equipped with X-Act [[lmn:microanalisi|microanalysis]].
+====== Resources ======
+You can find detailed description in {{lmn:brochure.pdf|SUPRA™ 40 Brochure}}